发明名称 ANALYTICAL DATA PRODUCING DEVICE, ANALYTICAL DATA PRODUCING METHOD, ANALYTICAL DATA PRODUCING PROGRAM, AND ANALYZER
摘要 PROBLEM TO BE SOLVED: To quickly and correctly produce analytical data including the thermal conductivity of the contact surface in a short time by automatically setting the thermal resistance corresponding to the contact state of two components when producing the analysis data based on the 3D-design data of the structure composed of a plurality of components. SOLUTION: The analytical data producing device comprises: the extraction part 21 for extracting the end surfaces of two components mutually being in contact from the 3D-design data of the structure composed of a plurality of components; the contact condition setting part 23 for setting the contact condition of the contact surface; the holding part 22 for previously holding the thermal resistance information for obtaining the thermal resistance of the regarding contact surface corresponding to the contact condition; the coefficient of thermal conductivity calculating part 24 for calculating the coefficient of thermal conductivity of the contact surface from the thermal resistance information corresponding to the contact condition of the contact surface set by the contact condition setting part 23 held in the holding part 22; and the formation part 26 for forming the analysis data including the thermal conductive coefficient calculated by the thermal conductivity calculation part 24. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007316032(A) 申请公布日期 2007.12.06
申请号 JP20060148830 申请日期 2006.05.29
申请人 FUJITSU LTD 发明人 URAKI YASUSHI
分类号 G01N25/18;G06F17/50 主分类号 G01N25/18
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