| 摘要 |
PROBLEM TO BE SOLVED: To provide a temperature cycle testing apparatus which can obtain the accurate temperature cycle lifetime of electronic components, with respect to temperature cycle. SOLUTION: The temperature cycle testing apparatus for examining the resistance of an electronic component to temperature difference comprises an electronic component holding section for holding the electronic component with it electrically continued and an electrical characteristics sensor for detecting the electrical characteristics of the electronic components. The apparatus can conduct temperature cycle testing, while verifying the electrical characteristics. COPYRIGHT: (C)2008,JPO&INPIT
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