发明名称 |
Method of testing electrochemical cells |
摘要 |
A method for determining whether a cell will experience unacceptable voltage delay later in its discharge life before it is incorporated into a device as its power source is described. As is standard practice, the cell is first subjected to a constant resistance load discharge followed by extended elevated temperature storage and an acceptance pulse discharge. This typically depletes the cell of about 1% to 3% of its theoretical discharge capacity. According to the present invention, the cell is again stored at an elevated temperature for an extended period followed by a second pulse discharge. This second pulse discharge is to ferret out any cell that may end up experiencing unacceptable voltage delay later in its discharge life.
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申请公布号 |
US2007279006(A1) |
申请公布日期 |
2007.12.06 |
申请号 |
US20050032428 |
申请日期 |
2005.01.10 |
申请人 |
TAKEUCHI ESTHER S;GAN HONG;DAVIS STEVEN;LEHNES JOSEPH |
发明人 |
TAKEUCHI ESTHER S.;GAN HONG;DAVIS STEVEN;LEHNES JOSEPH |
分类号 |
H02J7/00;G01N27/416 |
主分类号 |
H02J7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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