发明名称 Immersion lithography system and method having an immersion fluid confinement plate for submerging the substrate to be imaged in immersion fluid
摘要 A lithography apparatus having a fluid confinement plate, which completely submerges the imaging surface of a substrate, is disclosed. The apparatus includes an imaging element defining an image and a stage configured to support the substrate. A projection optical system is provided to project the image defined by the imaging element onto the imaging surface of the substrate. A gap, filled with immersion fluid, is provided between the imaging surface of the substrate and the last optical element of the projection optical system. The fluid confinement plate, which is positioned within the gap between the last optical element and the substrate, is sufficiently sized so that the imaging surface is completely submerged in the immersion fluid. The fluid confinement plate includes a first surface facing the gap and opposing the imaging surface of the substrate. The first surface includes a droplet control element to control the formation of droplets forming on the first surface. In one embodiment, the droplet control element is a porous surface formed on the first surface. A vacuum is used to pull any excess immersion fluid through the porous region to prevent the formation of droplets. In a second embodiment, the droplet control element is a sloped surface that causes any immersion fluid on the first surface to flow toward to main body of immersion fluid in the gap.
申请公布号 US2007279608(A1) 申请公布日期 2007.12.06
申请号 US20060523595 申请日期 2006.09.20
申请人 NIKON CORPORATION 发明人 POON ALEX KA TIM;KHO LEONARD WAI FUNG;KESWANI GAURAV;COON DEREK
分类号 G03B27/42 主分类号 G03B27/42
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