发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a structure and a manufacturing method of a semiconductor device which permits sufficient gettering. SOLUTION: The semiconductor device is constituted of a first semiconductor layer of a first conductive type, a second semiconductor layer laminated on the first semiconductor layer while having a second conductive type and high impurity concentration, a third semiconductor layer laminated on the second semiconductor layer while having a second conductive type and low impurity concentration, and an element unit constituted on the third semiconductor layer. In the manufacturing method of such a semiconductor device, deposit process for depositing the deposition nucleus of the first semiconductor layer before a process effected under the temperature atmosphere of higher than 1,200°C after laminating the second semiconductor layer on the first semiconductor layer, and an IG layer forming process for forming an IG layer by growing the deposited nucleus are carried out. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007317875(A) 申请公布日期 2007.12.06
申请号 JP20060145665 申请日期 2006.05.25
申请人 DENSO CORP 发明人 TOMATSU YUTAKA
分类号 H01L29/739;H01L21/28;H01L21/322;H01L21/336;H01L29/78 主分类号 H01L29/739
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