Integrated memory device e.g. flash electrically erasable programmable ROM memory, for e.g. secure digital card, has signal source producing clock signal with preset frequency that is provided to connection of interface in operation mode

摘要

The device (201) has an external control circuit (104) functionally connected with a memory cell selection device (103) and an interface (107). The control circuit comprises a signal source (206) that is arranged in such a manner that the source produces a clock signal with different frequencies. The clock signal with a preset frequency is provided to a connection of the interface in a test operation mode of the memory device, where the frequency is assigned to a predetermined operating parameter. Independent claims are also included for the following: (1) a method for testing an integrated storage device (2) a method for manufacturing a memory card or an electronic component.