发明名称 Analysis data generating apparatus , method and program
摘要 <p>The present invention has an object for automatically setting thermal resistance corresponding to a contact condition of a contact face between two elements and generating analysis data including a thermal conductivity of the contact face accurately and quickly when analysis data is generated based on three-dimensional design data of an object formed by a plurality of elements. The item analyzed may be a printed board. The analysis data generating unit includes an extracting unit 21 for extracting contact face data where end faces of two elements contact with each other from three-dimensional design data of an object formed by a plurality of elements. Also included is a contact condition setting unit 23 for setting a contact condition of the contact face (whether adhesived, glued etc); a retaining unit 22 for previously retaining thermal resistance information for obtaining thermal resistance of the contact face in accordance with contact condition of the contact face; a thermal conductivity calculating unit 24 for calculating a thermal conductivity of the contact face based on the thermal resistance information which is retained in the retaining unit 22 and corresponds to the contact condition of the contact face set by the contact condition setting unit 23. Further, there is a generating unit 26 for generating the analysis data including the thermal conductivity calculated by the thermal conductivity calculating unit 24.</p>
申请公布号 GB2438639(A) 申请公布日期 2007.12.05
申请号 GB20060018636 申请日期 2006.09.21
申请人 FUJITSU LIMITED 发明人 YASUSHI URAKI
分类号 G06F17/50;G01N25/18 主分类号 G06F17/50
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