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发明名称
APPARATUS FOR OPTICALLY CHARACTERISING THIN LAYERED MATERIAL
摘要
申请公布号
KR100781745(B1)
申请公布日期
2007.12.04
申请号
KR20017004750
申请日期
2001.04.14
申请人
发明人
分类号
G01N21/65
主分类号
G01N21/65
代理机构
代理人
主权项
地址
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