发明名称 METHOD FOR FABRICATING FLASH MEMORY DEVICE
摘要 <p>A method for fabricating a flash memory device is provided to increase an overlap area between a floating gate and a control gate by forming the floating gate with a concave shape. A first conductive layer(12), an etch-stop layer(13), and a second conductive layer(14) are stacked on a semiconductor substrate(10). A trench is formed by etching the second conductive layer and the etch-stop layer. A third conductive layer is formed on an entire surface including the trench. A concave floating gate(17) is formed by etching the third conductive layer having a predetermined interval from the trench, the second conductive layer, the etch-stop layer, and the first conductive layer. The etch-stop layer is formed with a conductive layer or an insulating layer.</p>
申请公布号 KR20070114516(A) 申请公布日期 2007.12.04
申请号 KR20060048200 申请日期 2006.05.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG, YOUNG OK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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