发明名称 |
System and method for automatic extraction of testing information from a functional specification |
摘要 |
A system and method for testing a development device includes extracting multiple parameters of the development device from a product specification for the development device. The parameters being arranged in a predetermined first order. The parameters are stored in a testing data file. The testing data file can be input into a test bench system being coupled to the development device. The test bench system can test the development device.
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申请公布号 |
US7305332(B1) |
申请公布日期 |
2007.12.04 |
申请号 |
US20040758070 |
申请日期 |
2004.01.14 |
申请人 |
ADAPTEC, INC. |
发明人 |
LEE DOUGLAS;KONG FANYUN (MICHELLE);SPITZER MARC;PACKER JOHN |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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