发明名称 PHASE CHANGE RANDOM ACCESS MEMORY DEVICE AND FIRING METHOD THEREOF
摘要 <p>A phase-change memory device and its firing method are provided to improve a stable firing operation by using a write circuit for supplying a write pulse and a firing pulse without employing an additional circuit block. A phase-change memory device is comprised of an address buffer(128), a low decoder(124), a column decoder(126), a memory cell array(110), and a write circuit(130). The memory cell array includes a plurality of phase-change memory cells. The write circuit supplies a write pulse for writing write date on the phase-change memory cell in response to a first voltage from the external at normal operation mode, and a firing pulse for firing the phase-change memory cell in response to a second voltage from the external at test mode. The first voltage is a source voltage and the second voltage is an external boosted voltage having a voltage level higher than that of the first voltage.</p>
申请公布号 KR100781550(B1) 申请公布日期 2007.12.03
申请号 KR20060110059 申请日期 2006.11.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HYE JIN;LEE, KWANG JIN;KIM, DU EUNG;CHO, WOO YEONG;CHOI, CHANG HAN;LIM, KI WON
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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