发明名称 |
PHASE CHANGE RANDOM ACCESS MEMORY DEVICE AND FIRING METHOD THEREOF |
摘要 |
<p>A phase-change memory device and its firing method are provided to improve a stable firing operation by using a write circuit for supplying a write pulse and a firing pulse without employing an additional circuit block. A phase-change memory device is comprised of an address buffer(128), a low decoder(124), a column decoder(126), a memory cell array(110), and a write circuit(130). The memory cell array includes a plurality of phase-change memory cells. The write circuit supplies a write pulse for writing write date on the phase-change memory cell in response to a first voltage from the external at normal operation mode, and a firing pulse for firing the phase-change memory cell in response to a second voltage from the external at test mode. The first voltage is a source voltage and the second voltage is an external boosted voltage having a voltage level higher than that of the first voltage.</p> |
申请公布号 |
KR100781550(B1) |
申请公布日期 |
2007.12.03 |
申请号 |
KR20060110059 |
申请日期 |
2006.11.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HYE JIN;LEE, KWANG JIN;KIM, DU EUNG;CHO, WOO YEONG;CHOI, CHANG HAN;LIM, KI WON |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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