A DIGITAL ONBOARD USING SQUIB DEVICE TEST CIRCUIT

摘要

A digital onboard using a squib device test circuit is provided to increase survival of a guided missile and operation of a system for the guided missile by checking errors of a squib driving circuit and a wire from a distance. A digital onboard using a squib device test circuit comprises a communication device, a micro processor, and the squib device test circuit. The communication device enables a guided missile to communicate with a guided missile launching control device at a long distance. The micro processor controls the communication device. The squib device test circuit tests a squib device. The squib device sends and receives a test current to the squib device test device. The squib device test device includes a squib device direct connection circuit(1), a test current generating circuit(2), and a squib device equivalent resistance measuring circuit(3). The squib device direct connection circuit groups a plurality of squib devices as one. The test current generating circuit feeds test current of 1mA to the squib device direct connection circuit. The squib device equivalent resistance measuring circuit receives test current from the squib device direct connection circuit to measure voltage applied to equivalent resistance of the squib device. A self-diagnosis circuit is installed in the test current generating circuit.