发明名称 Examination Apparatus, Fluoroscopy Apparatus, Examination Method, And Experimental Method
摘要 Even when the magnifying power is reduced, an image can be obtained at high resolution without significantly reducing the numerical aperture, and examination accuracy is improved. There is provided a microscope examination apparatus including a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses 5 a and 5 b is provided.
申请公布号 US2007273877(A1) 申请公布日期 2007.11.29
申请号 US20050594311 申请日期 2005.03.29
申请人 KAWANO YOSHIHIRO;SHIMIZU KEIJI;SUKEKAWA MINORU;MOCHIZUKI TSUYOSHI;HONDA SUSUMU;HAYASHI KAZUHIRO 发明人 KAWANO YOSHIHIRO;SHIMIZU KEIJI;SUKEKAWA MINORU;MOCHIZUKI TSUYOSHI;HONDA SUSUMU;HAYASHI KAZUHIRO
分类号 G01J3/30;G01N21/64;G02B21/00;G02B21/24;G02B21/36 主分类号 G01J3/30
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