发明名称 |
Examination Apparatus, Fluoroscopy Apparatus, Examination Method, And Experimental Method |
摘要 |
Even when the magnifying power is reduced, an image can be obtained at high resolution without significantly reducing the numerical aperture, and examination accuracy is improved. There is provided a microscope examination apparatus including a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses 5 a and 5 b is provided.
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申请公布号 |
US2007273877(A1) |
申请公布日期 |
2007.11.29 |
申请号 |
US20050594311 |
申请日期 |
2005.03.29 |
申请人 |
KAWANO YOSHIHIRO;SHIMIZU KEIJI;SUKEKAWA MINORU;MOCHIZUKI TSUYOSHI;HONDA SUSUMU;HAYASHI KAZUHIRO |
发明人 |
KAWANO YOSHIHIRO;SHIMIZU KEIJI;SUKEKAWA MINORU;MOCHIZUKI TSUYOSHI;HONDA SUSUMU;HAYASHI KAZUHIRO |
分类号 |
G01J3/30;G01N21/64;G02B21/00;G02B21/24;G02B21/36 |
主分类号 |
G01J3/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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