发明名称 IC TESTER AND ATTACHMENT METHOD FOR TESTBOARD
摘要 An IC tester and an installing method of a test board are provided to reduce an installation space by rotating the test board using a rotation plate to set the test board horizontally or almost vertically. A plurality of axes(21,22) is installed at both sides of a test board(2). A rotating plate(4) includes grooves(41,42) for inserting the axes, and sets the test board horizontally or almost vertically by the rotation. A cylinder(5) supporting the rotation plate is installed on the rotating plate. The rotation plate and the cylinder are installed on a test head. And the rotation plate is installed to be rotated, and the cylinder is installed, and then a manipulator for rotating the test head is installed.
申请公布号 KR20070113970(A) 申请公布日期 2007.11.29
申请号 KR20070040745 申请日期 2007.04.26
申请人 YOKOGAWA ELECTRIC CORPORATION 发明人 OHTA HIROSHI
分类号 H01L21/66 主分类号 H01L21/66
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