发明名称 Increasing photoresist processing throughput
摘要 Two acids may be formed per exposed photon using free radical promotion so that two acid products are produced via two parallel pathways. This results in increased fabrication facility throughput. In some embodiments, this may be achieved while reducing side-lobe defect liability.
申请公布号 US2007275323(A1) 申请公布日期 2007.11.29
申请号 US20060441767 申请日期 2006.05.26
申请人 发明人 FRYER DAVID;SINGH VIVEK;SUETIN NIKOLAY;GRANOVSKY ALEX A.
分类号 G03C1/00 主分类号 G03C1/00
代理机构 代理人
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