| 摘要 |
A probe of a probe card is provided to facilitate a maintenance of the probe by enabling a user to easily replace a connection pin, which is contaminated or damaged, which a new connection pin. A probe of a probe card includes a fixed connector(110), a contact probe(120) and a separation guide member(130). The fixed connector is inserted into a contact hole of the probe card. A connection pin is formed at one end of the fixed connector. The contact probe includes a base portion, which is integrated with the fixed connector. A contact tip is formed on the base portion, such that the contact probe is contacted with a DUT(Device Under Test). The separation guide member is formed on a connection portion between the contact probe and the fixed connector. When the contact probe is pulled from the fixed connector, the contact probe is separated from the fixed connector with respect to the separation guide member. |
