发明名称 MANUFACTURING METHOD FOR CLEANING SHEET AND FOR TRANSFER MEMBER WITH CLEANING FUNCTION, AND CLEANING METHOD FOR SUBSTRATE PROCESSING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide manufacturing methods for cleaning sheet and transfer member with cleaning function which are superior in foreign matter removing performance and transfer performance, and can suppress contamination caused by a silicon compound in a cleaning layer, and to provide a cleaning method for substrate processing device using such a cleaning sheet and a transfer member with cleaning function as above. SOLUTION: In the cleaning layer, relative strengths (a positive ion is a C<SB>2</SB>H<SB>3</SB><SP>+</SP>ratio, and a negative ion is an O<SP>-</SP>ratio) of a specified fragment ion of the cleaning layer are 0.1 or less respectively in a time-of-flight type secondary ion mass spectrometry. In the manufacturing method for cleaning sheet, plasma treatment is performed for the cleaning layer wherein the relative strength (the positive ion is the C<SB>2</SB>H<SB>3</SB><SP>+</SP>ratio, and the negative ion is the O<SP>-</SP>ratio) of at least one fragment ion of the specified fragment ions is 0.1 or less in the time-of-flight type secondary ion mass spectrometry. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007311699(A) 申请公布日期 2007.11.29
申请号 JP20060141493 申请日期 2006.05.22
申请人 NITTO DENKO CORP 发明人 NAMIKAWA AKIRA;TERADA YOSHIO;UENDA DAISUKE;SUGAO HISAKI
分类号 H01L21/304;H01L21/677 主分类号 H01L21/304
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