发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device of an insulating gate type, wherein an electric power loss upon a turn-off is restrained, whereas an on voltage is reduced between a collector and an emitter. SOLUTION: An n-type first base layer 2 is formed on a semiconductor substrate 1 having a first main face and second main face, and a p-type second base layer 3 is formed on its upper layer. A carrier storing layer 4 is formed between the first base layer 2 and the second base layer 3. The carrier storing layer 4 has a high concentration impurity layer 4a and a low concentration impurity layer 4b. The high concentration impurity layer 4a has a thickness of 1.5μm or more, and an impurity concentration of this layer is set to 1.0×10<SP>16</SP>cm<SP>-3</SP>or more throughout the entire layer. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007311627(A) 申请公布日期 2007.11.29
申请号 JP20060140313 申请日期 2006.05.19
申请人 MITSUBISHI ELECTRIC CORP 发明人 HARADA TATSUO
分类号 H01L29/739;H01L29/78 主分类号 H01L29/739
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