发明名称 APPARATUS, METHOD, AND PROGRAM FOR HEAT TREATMENT, AND RECORDING MEDIUM HAVING THE PROGRAM RECORDED THEREIN
摘要 PROBLEM TO BE SOLVED: To provide a heat treatment apparatus for heat-treating a substrate capable of obtaining a uniform temperature in the surface of the substrate during the heat treatment, and capable of obtaining a uniform pattern line width, a heat treatment method, a heat treatment program, and a recording medium having that program recorded therein. SOLUTION: This heat treatment apparatus comprises a substrate holding means for holding the substrate W, and a heating means 25 for heating the substrate W held by the substrate holding means from above and/or from below. The substrate holding means has a mount 24 on which the substrate W is mounted, and airflow forming means 51-56 for forming an airflow between the substrate W and the mount 24. Upon the heating treatment by the heating means 25, the substrate W is supported at the whole undersurface thereof by the airflow formed by the airflow forming means 51-56 and is held in a floating state thereof. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007311520(A) 申请公布日期 2007.11.29
申请号 JP20060138521 申请日期 2006.05.18
申请人 TOKYO ELECTRON LTD 发明人 FUKUOKA TETSUO;SHIBATA TAKESHI
分类号 H01L21/027 主分类号 H01L21/027
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