Apparatus and method for processing a signal under test using a trigger signal synchronous with the signal under test for arbitrary impedance loads

摘要

A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (_L) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional acquired samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.