Memory e.g. static random access memory, has input register connected with data input and input/output circuit, and output register connected with circuit, where output register continues to give test data to input register in test mode

摘要

The memory (1) has an input/output circuit (3) connected with memory cells (2) of a memory field (4) and exchanges data with the memory cells. An output register (5) is connected with the input/output circuit. An input register (6) is connected with a data input (13) and with the input/output circuit. The data are provided into the memory cells over the data input and the input register. The output register continues to give test data to the input register in the test mode, and the test data are transmitted from the input register for the input/output circuit. An independent claim is also included for a method for testing a random access memory.