发明名称 MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To provide a mass spectrometer that realizes size reduction and constituted so as to analyze, even a trace amount of a measuring target gas present in a sample. SOLUTION: The mass spectrometer is equipped with an ionization chamber 3 for ionizing the sample, a sample inlet part 4 for introducing the sample into the ionization chamber 3, the selective concentration part 5 provided in the ionization chamber 3, to selectively concentrating the measuring target gas S from the sample introduced by the sample inlet part 4, a light irradiation part 2 for irradiating the measuring target gas S concentrated by the selective concentration part 5 with ultraviolet rays L for ionizing the measuring target gas S and a mass analysis part 7 for analyzing the mass of the measuring target gas S ionized by the light irradiation part 2. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007309879(A) 申请公布日期 2007.11.29
申请号 JP20060141561 申请日期 2006.05.22
申请人 HORIBA LTD;KYOTO UNIV;UNIV NAGOYA;UNIV OF TOKYO 发明人 YABUSHITA AKIHIRO;KAWASAKI MASAHIRO;MATSUMI YUTAKA;TONOKURA KENICHI
分类号 G01N27/64;G01N27/62;H01J49/16 主分类号 G01N27/64
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