发明名称 Methods and Systems for Analyzing Samples Using Particle Irradition
摘要 Systems and methods for an in situ, non destructive analysis of organic or inorganic material are disclosed. In one respect, a particle induced x-ray emission system, having a footprint of less than one square meter, includes a sample holder supporting a sample, a source holder supporting one or more radioactive source and a detector. A radioactive transmission from the one or more radioactive source to the sample results in a fluorescent emission of the sample and collected by the detector. In one respect, fluorescent emission may be used to determine elements found in the sample. Additionally, the amounts of each of the determined elements found in the sample may also be determined.
申请公布号 US2007274455(A1) 申请公布日期 2007.11.29
申请号 US20070681613 申请日期 2007.03.02
申请人 THE BOARD OF REGENTS OF THE UNIVERSITY OF TEXAS SYSTEM 发明人 TARAWNEH CONSTANTINE;DASGUPTA-SCHUBERT NABANITA;PERSANS MICHAEL
分类号 H05G2/00 主分类号 H05G2/00
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