发明名称 A METHOD FOR MANUFACTURING POLYCRYSTAL SILICON THIN FILM
摘要 <p>A polycrystalline silicon thin film is provided to reduce a metal pollution remarkably caused by a direct contact of an amorphous material and a metal by diffusing the metal using a cover layer installed between the amorphous material and the metal. An amorphous silicon layer(30) is deposited on an insulating substrate(10). A first cover layer(40) is formed on the amorphous silicon layer. A metal(50) is formed on the first cover layer. A polycrystalline silicon thin film(31) is formed by heating the amorphous silicon layer to be crystallized. Remaining metal contained within the silicon thin film is removed by removing the first cover layer and the metal, forming a second cover layer(60) on the polycrystalline thin film, and then performing the heat treatment.</p>
申请公布号 KR20070113402(A) 申请公布日期 2007.11.29
申请号 KR20060046204 申请日期 2006.05.23
申请人 UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNG HEE UNIVERSITY 发明人 JANG, JIN;CHEON, JUN HYUK
分类号 H01L21/20;H01L21/324;H01L29/786 主分类号 H01L21/20
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