发明名称 |
PROBE POSITION CONTROL SYSTEM AND METHOD |
摘要 |
An apparatus and method for controlling a position of a probe are provided to enable more precise observation and manipulation of a work piece by calibrating a relative position of the work piece and the probe. An apparatus for controlling a position of a probe comprises a measuring member measuring interaction between the surface of a work piece and a region perpendicular to the surface, an oscillating member which oscillates the work piece and the probe at respective frequencies(f1,f2), a tracing member, a speed detecting member, and a calibrating member. The tracing member moves the probe relative to the work piece to detect a point at which the frequencies do not exist. The speed detecting member detects a relative speed based on the relative movement obtained by the tracing member. The calibrating member calibrates the relative position of the probe and the work piece using the speed. |
申请公布号 |
KR20070114033(A) |
申请公布日期 |
2007.11.29 |
申请号 |
KR20070050792 |
申请日期 |
2007.05.25 |
申请人 |
SHIMADZU CORPORATION;OSAKA UNIVERSITY |
发明人 |
ABE MASAYUKI;OHTA MASAHIRO;SUGIMOTO YOSHIAKI;MORITA KENICHI;OYABU NORIAKI;MORITA SEIZO;OSCAR CUSTANCE |
分类号 |
G01B21/30;G01Q10/04;G01Q10/06;G01Q30/04;G01Q30/06;G01Q60/32;H01J37/00 |
主分类号 |
G01B21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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