发明名称 PROBE POSITION CONTROL SYSTEM AND METHOD
摘要 An apparatus and method for controlling a position of a probe are provided to enable more precise observation and manipulation of a work piece by calibrating a relative position of the work piece and the probe. An apparatus for controlling a position of a probe comprises a measuring member measuring interaction between the surface of a work piece and a region perpendicular to the surface, an oscillating member which oscillates the work piece and the probe at respective frequencies(f1,f2), a tracing member, a speed detecting member, and a calibrating member. The tracing member moves the probe relative to the work piece to detect a point at which the frequencies do not exist. The speed detecting member detects a relative speed based on the relative movement obtained by the tracing member. The calibrating member calibrates the relative position of the probe and the work piece using the speed.
申请公布号 KR20070114033(A) 申请公布日期 2007.11.29
申请号 KR20070050792 申请日期 2007.05.25
申请人 SHIMADZU CORPORATION;OSAKA UNIVERSITY 发明人 ABE MASAYUKI;OHTA MASAHIRO;SUGIMOTO YOSHIAKI;MORITA KENICHI;OYABU NORIAKI;MORITA SEIZO;OSCAR CUSTANCE
分类号 G01B21/30;G01Q10/04;G01Q10/06;G01Q30/04;G01Q30/06;G01Q60/32;H01J37/00 主分类号 G01B21/30
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