| 摘要 |
PROBLEM TO BE SOLVED: To provide a direct-current testing device capable of reducing useless power consumption at the waiting time. SOLUTION: This direct-current testing device has a power amplifying circuit 130 for supplying a current to DUT at the current application voltage measuring time. The power amplifying circuit 130 is equipped with transistors 18, 20 for generating an output current corresponding to an input current at the current application time, resistances 54, 56, and a variable resistance circuit 40 for setting a waiting current flowing in the transistors 18, 20 or the like lighter than the case at the current application time, at the other time. COPYRIGHT: (C)2008,JPO&INPIT |
