| 摘要 |
PROBLEM TO BE SOLVED: To appropriately inspect an electro-optic device of a demultiplexer system. SOLUTION: The electro-optic device includes scan lines 11a, data lines 6a in blocks for each four lines, data signal terminals 102d to input data signals, a demultiplexer 7 which selects one of the data lines belonging to each block and designated by control signals Sel1 to Sel4 and supplies the data signal to the selected data line 6a, and a pixel unit 700 disposed in accordance with intersections of the scan lines 11a and the data lines 6a. The device also has an inspection circuit 160 having (i) read lines 169, (ii) TFTs 164 connected between the data lines 6a and the read lines 169, (iii) a shift register 162 which selects one of the blocks and turns on the TFT 164 corresponding to the data line belonging to the selected block, and an inspection PAD 170 connected to the output side in the final stage of the shift register 162. COPYRIGHT: (C)2008,JPO&INPIT |
