发明名称 High yield, high density on-chip capacitor design
摘要 A capacitance circuit assembly mounted on a semiconductor chip, and method for forming the same, comprising a plurality of divergent capacitors in a parallel circuit connection between first and second ports, the plurality comprising at least one Metal Oxide Silicon Capacitor and at least one capacitor selected from the group comprising a Vertical Native Capacitor and a Metal-Insulator-Metal Capacitor. In one aspect, the assembly has vertical orientation, the Metal Oxide Silicon capacitor located at the bottom and defining the footprint, middle Vertical Native Capacitor comprising a plurality of horizontal metal layers comprising a plurality of parallel positive plates alternating with a plurality of parallel negative plates. In another aspect, a vertically asymmetric orientation provides a reduced total parasitic capacitance.
申请公布号 US2007268653(A1) 申请公布日期 2007.11.22
申请号 US20060436248 申请日期 2006.05.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KIM JONGHAE;KIM MOON J.;PLOUCHART JEAN-OLIVIER;TRZCINSKI ROBERT E.
分类号 H01G4/38 主分类号 H01G4/38
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