发明名称 METHOD FOR DETECTING OR QUANTIFYING WHEAT ENDOGENOUS DNA AND METHOD FOR DETERMINING CONTAMINATION RATE OF GENETICALLY MODIFIED WHEAT IN TEST SAMPLE
摘要 It is intended to find a wheat endogenous sequence which meets the conditions that a) it is common among wheat varieties, b) its abundance (detection amount) is not biased depending on wheat varieties, c) it does not cross over even if other crop is present and can be detected only in bread wheat and d) it can be amplified quantitatively by a PCR reaction and to provide a method for accurately detecting or quantifying wheat endogenous DNA in a test sample by a polymerase chain reaction. The invention provides a method for detecting or quantifying wheat endogenous DNA in a test sample by a polymerase chain reaction which includes the steps of amplifying a nucleic acid in a region composed of a nucleotide sequence represented by SEQ ID NO: 2 or a partial sequence thereof using a nucleic acid in the test sample or a nucleic acid extracted from the test sample as a template and a pair of amplifiable primers contained in the region and detecting or quantifying the amplified nucleic acid.
申请公布号 WO2007132760(A1) 申请公布日期 2007.11.22
申请号 WO2007JP59727 申请日期 2007.05.11
申请人 NISSHIN SEIFUN GROUP INC.;IMAI, SHINJIRO;TANAKA, KEIKO 发明人 IMAI, SHINJIRO;TANAKA, KEIKO
分类号 C12N15/09;C12Q1/68 主分类号 C12N15/09
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