INSPECTION METHOD FOR DISPLAY SUBSTRATE, AND INSPECTION DEVICE FOR DISPLAY SUBSTRATE USING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide an inspection method for a display substrate improved in reliability of inspection, and an inspection device for the display substrate using the same. SOLUTION: The method for inspecting a display substrate including test wires, a signal application pad electrically connected with each of test wires, and a signal line electrically connected with the signal application pad comprises: inspecting whether a first signal failure occurs or not by applying a first test signal to the test wires; mutually short-circuiting the signal application pads in the occurrence of the first signal failure; and inspecting whether a second signal failure occurs or not by applying a second test signal to the test wires. The signal application pads are mutually short-circuited after the inspection for the first signal failure, and the inspection for the second signal failure is further performed, whereby in which part of a display panel a failure has occurred is acquired. COPYRIGHT: (C)2008,JPO&INPIT