发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR EXECUTING TEST OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve a problem in which setting of a test mode requires a terminal for inputting a test mode setting signal. SOLUTION: The semiconductor device comprises a reset terminal inputting a reset control signal for resetting an internal circuit; a reset detection part generating, according to the input reset control signal, a reset release signal for releasing reset of the internal circuit; and a mode capture part retaining, based on the signal input to the reset terminal, a test mode for testing operations of the internal circuit. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007304073(A) 申请公布日期 2007.11.22
申请号 JP20060135784 申请日期 2006.05.15
申请人 NEC ELECTRONICS CORP 发明人 KUWABARA TAKESHI
分类号 G01R31/28;G01R31/3185;H01L21/822;H01L27/04 主分类号 G01R31/28
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