发明名称 Structure and manufacturing method of high precision chip capacitor fabricated on silicon substrate
摘要 The present invention provides a structure and the manufacturing method of high precision chip capacitor fabricated on silicon substrate. The structure of the chip capacitor consists of a dielectric layer formed on the surface of a heavily doped silicon substrate with an inner primary portion of thin oxide and an outer secondary portion of thicker oxide; both oxides are merged seamlessly together into the single dielectric layer thus allowing a layer of electrically conducting film deposited on its surface as the first electrode of the capacitor, while the heavily doped silicon substrate on the opposite surface of the dielectric oxide plays as the bottom electrode. The bottom electrode is electrically connected up to a second electrode on the upper surface through a via so that both the first and second electrodes can be on the same surface for subsequent bumping process, finally, two solder bumps is formed on the top as a surface mountable chip capacitor component.
申请公布号 US2007267719(A1) 申请公布日期 2007.11.22
申请号 US20060437074 申请日期 2006.05.18
申请人 SHIE JIN SHOWN 发明人 SHIE JIN SHOWN
分类号 H01L29/00 主分类号 H01L29/00
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