| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor storage device where the number of error correctable bits can be changed according to the reliability and economic efficiency of data. <P>SOLUTION: In the semiconductor storage device provided with an error detection correction system, a first operation mode for performing 2-bit error correction using a BCH code and a second operation mode for performing 1-bit error correction are set to the error detection correction system switchably by sharing a main part of the system. <P>COPYRIGHT: (C)2008,JPO&INPIT |
