发明名称 PARTICLE IMAGE ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To provide a particle image analyzer capable of analyzing particle images imaged using dark-field illumination to acquire morphological characteristic information, while simplifying imaging processes of transparent particles. <P>SOLUTION: The particle image analyzer includes an illuminating optical system 4 for implementing dark-field illumination to particles, an imaging optical system 5 for imaging particles dark-field-illuminated, an image processing substrate 6 extracting particle image from taken images by dark-field illumination to derive morphological characteristic information representing morphological characteristics of particles by analyzing the extracted particle images and an imagery data processing section 2b. The image processing substrate 6 and the imagery data processing section 2b are comprised to extract particle images from imaged imageries, based on a larger threshold value than brightness corresponding substantially to background of particle images. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007304044(A) 申请公布日期 2007.11.22
申请号 JP20060135033 申请日期 2006.05.15
申请人 SYSMEX CORP 发明人 FUJII KOZO;YAMAGUCHI KATSUAKI
分类号 G01N15/14;G01N15/02;G06T1/00 主分类号 G01N15/14
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