发明名称 THICKNESS MEASURING MECHANISM FOR COATING LAYER AND COATING LAYER FORMING DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a means where the variation of the carrying speed during the formation of a coating layer on the surface of a long-length base material being fed continuously is suppressed, and further, the influence by the fluctuation of the measured face in the thickness direction at thickness detection parts in the process of the carrying is made the minimum, and the thickness of the coating layer can be measured at higher precision. SOLUTION: In the measuring mechanism provided at a device where a coating layer is formed on the surface of an electrically conductive long-length base material while it is carried, and which continuously confirms the thickness of the coating layer, detection parts of measuring the electrostatic capacitance value of the coating layer are arranged before and behind the treatment part, and the tension applied to the base material in the detection parts is set to the one higher than the tension applied to the base material in the base. In this way, the thickness of the coating layer can be measured at higher precision, and, by using the measuring mechanism, the provision of a coating layer forming device having high reliability in thickness data at the detection parts and a coating base material having high precision is made possible. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007302929(A) 申请公布日期 2007.11.22
申请号 JP20060130924 申请日期 2006.05.10
申请人 SUMITOMO ELECTRIC IND LTD 发明人 AWATA HIDEAKI;EMURA KATSUJI;YOSHIDA KENTARO
分类号 C23C14/54 主分类号 C23C14/54
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