发明名称 |
Programmable address space built-in self test (BIST) device and method for fault detection |
摘要 |
A built-in self-test (BIST) circuit for testing addressable locations can include a BIST generator ( 202 ) that can generate test addresses for testing each addressable location. Defective addresses can be stored in a fault address store ( 216 ). An address range selector circuit ( 230 ) can limit the range of addresses generated by an address generator ( 234 ). Once defective addresses for a first range have been detected, an address range selector circuit ( 230 ) can test another range. An entire address range can thus be tested regardless of the depth of a fault address store ( 216 ).
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申请公布号 |
US2007271482(A1) |
申请公布日期 |
2007.11.22 |
申请号 |
US20070713258 |
申请日期 |
2007.03.02 |
申请人 |
DODDAMANE RAMESHA;VADLAMANI ESWAR;KRISHNAN GOPALAKRISHNAN P;SINGH TARJINDER |
发明人 |
DODDAMANE RAMESHA;VADLAMANI ESWAR;KRISHNAN GOPALAKRISHNAN P.;SINGH TARJINDER |
分类号 |
G06F11/00;G06F12/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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