| 发明名称 |
Parametric Measurement of High-Speed I/O Systems |
| 摘要 |
A phase comparator is used to test a device under test comprising an input/output (I/O) circuit by applying a signal to the device under test; extracting a phase signal from the phase comparator; and determining parametric information pertaining to the I/O circuit of the device under test from the phase signal.
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| 申请公布号 |
US2007268963(A1) |
申请公布日期 |
2007.11.22 |
| 申请号 |
US20060419003 |
申请日期 |
2006.05.18 |
| 申请人 |
WALLACE HUGH S;SEET ADRIAN WAN-CHEW;HILLIGES KLAUS-DIETER |
发明人 |
WALLACE HUGH S.;SEET ADRIAN WAN-CHEW;HILLIGES KLAUS-DIETER |
| 分类号 |
H04B3/46 |
主分类号 |
H04B3/46 |
| 代理机构 |
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