发明名称 METHOD FOR FORMING SELF-ALIGNED METAL SILICIDE CONTACTS
摘要 <p>A method for forming self-aligned metal silicide contacts over at least two silicon-containing semiconductor regions that are spaced apart from each other by an exposed dielectric region is disclosed. Each of the self-aligned metal silicide contacts so formed comprises at least nickel silicide and platinum silicide with a substantially smooth surface, and the exposed dielectric region, is essentially free of metal and metal silicide. Nickel or nickel alloy deposition is followed by low-temperature annealing, nickel etching, high-temperature annealing, and aqua regla etching.</p>
申请公布号 WO2007133356(A1) 申请公布日期 2007.11.22
申请号 WO2007US08798 申请日期 2007.04.10
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;FANG, SUNFEI;KNARR, RANDOLPH, F.;KRISHNAN, MAHADEVAIYER;LAVOIE, CHRISTIAN;MO, RENEE, T.;PRANATHARTHIHARAN, BALASUBRAMANIAN;STRANE, JAY, W. 发明人 FANG, SUNFEI;KNARR, RANDOLPH, F.;KRISHNAN, MAHADEVAIYER;LAVOIE, CHRISTIAN;MO, RENEE, T.;PRANATHARTHIHARAN, BALASUBRAMANIAN;STRANE, JAY, W.
分类号 H01L21/44;C23F1/00 主分类号 H01L21/44
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