发明名称 |
METHOD FOR FORMING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a semiconductor device containing conductive metal compound film formed by deposition steps. SOLUTION: The semiconductor forming method of this invention comprises a step to form a primary conductive metal compound film on a substrate by an organometallic chemical vapor deposition process, and a step to form a secondary conductive metal compound film on the primary conductive metal compound film by a physical vapor deposition process. The primary and secondary conductive metal compound films are formed in a state where the exposure of the primary conductive compound film to atomic oxygen is prevented or minimized. Therefore, the degradation of the primary conductive metal compound film can be reduced. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2007306001(A) |
申请公布日期 |
2007.11.22 |
申请号 |
JP20070125947 |
申请日期 |
2007.05.10 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM JU YOUN;WON SEOK-JUN;KIM RAK-HWAN;SONG MIN WOO;KIM WEON-HONG;PARK JUNG-MIN |
分类号 |
H01L21/285;H01L21/28;H01L21/822;H01L27/04 |
主分类号 |
H01L21/285 |
代理机构 |
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主权项 |
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地址 |
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