发明名称 Magnetic resonance force microscope
摘要 <p>A magnetic resonance force microscope (MRFM) permitting deeper understanding of an MRI image. The microscope has an RF magnetic field generator (31) for producing an RF magnetic field uniformly over the whole of a sample (21). A cantilever self-excitation loop portion self-excites the cantilever (23). Spins in the sample are thus controlled to produce a magnetic resonance force. A frequency demodulator (26) measures the resonant frequency of the cantilever from the output detection signal from a cantilever displacement-measuring instrument (29) based on the magnetic resonance force. The shift of the resonant frequencyof the cantilever is measured. A scanner (22) is controlled to keep constant the DC component of the amount of shift in the cantilever resonant frequency. The distance from the sample surface to the probe tip (24a) is adjusted. A controlled signal of a scanner driver power supply (25) creates an AFM image of the sample. A phase detector (34) creates an MRFM image according to the AC component of the amount of shift in the cantilever resonant frequency in the frequency demodulator. </p>
申请公布号 EP1830172(A3) 申请公布日期 2007.11.21
申请号 EP20070250815 申请日期 2007.02.27
申请人 JEOL LTD.;KYOTO UNIVERSITY;YOKOHAMA CITY UNIVERSITY 发明人 TSUJI, SHIGENORI;YOSHINARI, YOHSUKE;SHIRAKAWA, MASAHIRO;KOKUBO, TETSURO
分类号 G01B7/34;G01Q60/50;G01Q60/52;G01Q60/54 主分类号 G01B7/34
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