发明名称 Optical proximity correction method
摘要 An integrated circuit layout includes dense figures and at least one isolated figure. A plurality of dummy patterns are formed to surround the isolated figure, so as to reduce the difference in pattern density of the integrated circuit layout. A transmitted light of the dummy patterns provides a phase difference of 0 or 180 degrees relative to a transmitted light of the integrated circuit layout. The integrated circuit layout and the plurality of dummy patterns are formed on a photo-mask.
申请公布号 US7297450(B2) 申请公布日期 2007.11.20
申请号 US20060380192 申请日期 2006.04.25
申请人 UNITED MICROELECTRONICS CORP. 发明人 HWANG JIUNN-REN;HUANG JUI-TSEN;HSIEH CHANG-JYH
分类号 G03F9/00;G03F1/00;G03F1/14 主分类号 G03F9/00
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