发明名称 Transparent metal shielded isolation for image sensors
摘要 An isolation region formed in a substrate and lined with a transparent metal layer. The isolation region provides isolation between adjacent active areas of an integrated circuit structure, for example the inventive region may provide isolation between pixels of a pixel array. Utilizing a transparent material maintains high quantum efficiency of the pixels as photons are not blocked from penetrating into the substrate. In one exemplary embodiment, a shallow trench isolation region is formed in a substrate, lined with an oxide or other dielectric, and an indium-tin-oxide shielding layer is formed over the oxide. The lined trench may then be filled with either the transparent metal material or a transparent insulating material.
申请公布号 US7297995(B2) 申请公布日期 2007.11.20
申请号 US20040923693 申请日期 2004.08.24
申请人 MICRON TECHNOLOGY, INC. 发明人 MOULI CHANDRA
分类号 H01L31/062;H01L29/00 主分类号 H01L31/062
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