发明名称 HANDLER FOR TESTING ELECTRONIC ELEMENTS
摘要 A handler for testing electronic elements is provided to check a failure in a test tray accurately and then to remove the fail simply. An exchange part(120) receives an electronic element from a loading part and then installs the electronic element on a test tray, and outputs the tested electronic element to an unloading part. At least one electronic element picker(140) transports electronic elements between the loading part and the exchange part and between the unloading part and the exchange part. An inspection part(150) is arranged in one side of the exchange part, and inspects the failure of a test tray arranged in the exchange part or the electronic element installed on the test tray, and/or corrects the failure of the electronic element. A test tray transport unit(200) moves the test tray to the inspection part, and moves the test tray arranged in the inspection part to the exchange part.
申请公布号 KR100776814(B1) 申请公布日期 2007.11.19
申请号 KR20060102025 申请日期 2006.10.19
申请人 MIRAE CORPORATION 发明人 AHN, JUNG UG;KIM, SUN HWAL;CHOI, WAN HEE;HUR, JUNG
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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