发明名称 |
Longitudinal pattern generating device for longitudinal calibration measuring instruments and quality metrological measurement e.g. automobile industry, has bank of calibration and dimension measuring equipment e.g. slide gauge |
摘要 |
#CMT# #/CMT# The device has a bank of calibration and dimension measuring equipment e.g. slide gauge, exteriors and interiors contacts micrometer, thickness gauge. #CMT#USE : #/CMT# Used for longitudinal pattern generation in longitudinal calibration measuring instruments and quality metrological measurement e.g. automobile industry, ship building or aircraft. |
申请公布号 |
ES2285883(A1) |
申请公布日期 |
2007.11.16 |
申请号 |
ES20040002917 |
申请日期 |
2004.11.29 |
申请人 |
UNIVERSIDAD DE SEVILLA |
发明人 |
GONZALEZ LOPEZ MERCEDES;DOMINGUEZ ABASCAL JAIME;LAPETRA CODERQUE CARLOS;GONZALEZ GOMEZ FRANCISCO M. |
分类号 |
G01B11/02 |
主分类号 |
G01B11/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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