发明名称 Longitudinal pattern generating device for longitudinal calibration measuring instruments and quality metrological measurement e.g. automobile industry, has bank of calibration and dimension measuring equipment e.g. slide gauge
摘要 #CMT# #/CMT# The device has a bank of calibration and dimension measuring equipment e.g. slide gauge, exteriors and interiors contacts micrometer, thickness gauge. #CMT#USE : #/CMT# Used for longitudinal pattern generation in longitudinal calibration measuring instruments and quality metrological measurement e.g. automobile industry, ship building or aircraft.
申请公布号 ES2285883(A1) 申请公布日期 2007.11.16
申请号 ES20040002917 申请日期 2004.11.29
申请人 UNIVERSIDAD DE SEVILLA 发明人 GONZALEZ LOPEZ MERCEDES;DOMINGUEZ ABASCAL JAIME;LAPETRA CODERQUE CARLOS;GONZALEZ GOMEZ FRANCISCO M.
分类号 G01B11/02 主分类号 G01B11/02
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