发明名称 Process of forming electronic device including a densified nitride layer adjacent to an opening within a semiconductor layer
摘要 A process of forming an electronic device can include patterning a semiconductor layer to define an opening extending to an insulating layer, wherein the insulating layer lies between a substrate and the semiconductor layer. After patterning the semiconductor layer, the opening can have a bottom, and the semiconductor layer can have a sidewall and a surface. The surface can be spaced apart from the insulating layer, and the sidewall can extend from the surface towards the insulating layer. The process can also include depositing a nitride layer within the opening, wherein depositing is performed using a PECVD technique. The process can further include densifying the nitride layer. The process can still further include removing a part of the nitride layer, wherein a remaining portion of the nitride layer can lie within the opening and be spaced apart from the surface.
申请公布号 US2007264839(A1) 申请公布日期 2007.11.15
申请号 US20060433298 申请日期 2006.05.12
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 VAN GOMPEL TONI D.;CHEN KUANG-HSIN;KANG LAEGU;MORA RODE R.;TURNER MICHAEL D.
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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