| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a device for acquiring specimen information such as a specimen analyzer, for making relatively short the time of measuring an electromagnetic wave transmitted by a specimen and that of measuring an electromagnetic wave reflected by it, and having a structure relatively easy to simplify or miniaturize. <P>SOLUTION: The device comprises an electromagnetic wave generating means, a specimen holding means 101, an electromagnetic wave detecting means, and a processing means. The holding means 101 has a function as a light polarizer 102 with a polarization axis for defining the dividing manner of an incoming electromagnetic wave 104 according to the polarized state thereof, and holds the specimen 103. The detecting means detects a transmitted electromagnetic wave 105 transmitted by the holding means 101 and a reflected electromagnetic wave 106 reflected by the holding means 101, respectively, into which the electromagnetic wave 104 is divided according to the polarized state of the electromagnetic wave 104 into the holding means 101 and to the relative relation between the holding means 101 and the polarization axis. The processing means processes a signal of an electromagnetic wave detected by the detecting means to acquire information on the specimen 103. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
