发明名称 THE PROBE, THE FIXTURE, AND APPARATUS FOR CIRCUIT BOARD INSPECTION
摘要 A probe, the fixture, and apparatus for circuit board inspection is provided to makes easy assembling of the fixture for circuit board inspection, the fixture for circuit board inspection which is easily assembled, and the apparatus for circuit board inspection which is easily assembled. A first pin body(80) which is comprised by the probe for circuit board inspection(22) is inserted to be able to slide into through hole(100) of the first guide base(62) as the end of the first pin body(80) which becomes a part for measurement is exposed to the outside. Compressed coil spring(84) which is comprised by the probe for circuit board inspection(22) is loosely inserted into through hole(114) of the second guide base(64) in opposition to the first guide base(62) at some distance. On the other hand, the end of other part of the first pin body(80) is inserted to be able to slide into the through hole(114) as well as the second pin body(82) which is comprised by the probe for circuit board inspection(22) is inserted and fixed as the end of other part which becomes external connection part is exposed to the outside.
申请公布号 KR20070109831(A) 申请公布日期 2007.11.15
申请号 KR20070039822 申请日期 2007.04.24
申请人 NIDEC-READ CORPORATION 发明人 HIROBE KOSUKE;FUJINO MAKOTO;KATO MINORU
分类号 G01R1/067;G01R31/26 主分类号 G01R1/067
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