发明名称 PHOTOMASK
摘要 <p><P>PROBLEM TO BE SOLVED: To form fine patterns under the same exposure conditions without depending on shapes or denseness degrees of patterns. <P>SOLUTION: An outline enhancing mask 1a comprises: a transmissive substrate 2a having transmissive property for exposure light; a semi-light-shielding portion 3a formed on the transmissive substrate 2a; an opening 4a formed by opening the semi-light-shielding portion 3a and corresponding to an isolated contact pattern; and a ring-like phase shifter 5a formed between the semi-light-shielding portion 3a and the opening 4a and surrounding the opening 4a. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007299018(A) 申请公布日期 2007.11.15
申请号 JP20070216932 申请日期 2007.08.23
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MITSUSAKA AKIO
分类号 G03F1/29;G03F1/32;G03F1/68 主分类号 G03F1/29
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