发明名称 Insulated gate semiconductor device
摘要 Channel regions and gate electrodes are also disposed continuously with transistor cells below a gate pad electrode. The transistor cells are formed in a stripe pattern and allowed to contact a source electrode. In this way, the channel regions and the gate electrodes, which are positioned below the gate pad electrode, are kept at a predetermined potential. Thus, a predetermined drain-source reverse breakdown voltage can be secured without providing a p<SUP>+</SUP> type impurity region on the entire surface below the gate pad electrode.
申请公布号 US2007262390(A1) 申请公布日期 2007.11.15
申请号 US20070797900 申请日期 2007.05.08
申请人 SANYO ELECTRIC CO., LTD. 发明人 ISHIDA HIROYASU;NOGUCHI YASUNARI
分类号 H01L29/94 主分类号 H01L29/94
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