发明名称 IMPROVED DURABILITY TEST METHOD OF CIS THIN FILM SOLAR CELL MODULE
摘要 <p><P>PROBLEM TO BE SOLVED: To properly evaluate characteristic of recovery of conversion efficiency or the like by irradiation of feeble light of a CIS thin film solar cell module. <P>SOLUTION: In the durability test method; continuous irradiation is carried out during a test period by adjusting intensity of a light source 1E, so that light from a pseudo solar light illuminating apparatus (solar simulator) 1D is irradiance of feeble light equivalent to a value of solar radiation of a cloudy day, that is, 100 to 300 W/m<SP>2</SP>while keeping temperature, humidity, and storage time with no change as in conventional high temperature high humidity storage test conditions of a CIS thin film solar cell module (temperature of 85°C, relative humidity of 85% and storage for 1,000 hours in darkness). Consequently, characteristic that a module 2' stored in its open state does not show remarkable deterioration even after passage of 1,000 hours can be properly evaluated. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007299969(A) 申请公布日期 2007.11.15
申请号 JP20060127193 申请日期 2006.05.01
申请人 SHOWA SHELL SEKIYU KK 发明人 KUSHIYA KATSUMI;KURIYAGAWA SATORU
分类号 H01L31/04 主分类号 H01L31/04
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